67 search results - page 9 / 14 » Measuring Software Functional Size: Towards an Effective Mea... |
SIMPRA
2008
13 years 7 months ago
2008
In this paper we analyze and evaluate the effects of some pre-defined process parameters on the performance of a manufacturing system. These parameters include two different plant...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
NOMS
2010
IEEE
13 years 5 months ago
2010
IEEE
—The online detection of anomalies is a vital element of operations in data centers and in utility clouds like Amazon EC2. Given ever-increasing data center sizes coupled with th...
ICCAD
2006
IEEE
14 years 4 months ago
2006
IEEE
Statistical static timing analysis (SSTA) has become a key method for analyzing the effect of process variation in aggressively scaled CMOS technologies. Much research has focused...
SIGOPS
2010
13 years 1 months ago
2010
Modern chip-level multiprocessors (CMPs) contain multiple processor cores sharing a common last-level cache, memory interconnects, and other hardware resources. Workloads running ...