260 search results - page 6 / 52 » Measuring power and temperature from real processors |
VLSID
2008
IEEE
14 years 9 months ago
2008
IEEE
Simultaneous Multi-Threading (SMT) processors are becoming popular because they exploit both instruction-level and threadlevel parallelism by issuing instructions from different t...
ISLPED
2006
ACM
14 years 3 months ago
2006
ACM
As semiconductor manufacturing technology scales to smaller device sizes, the power consumption of clocked digital ICs begins to increase. Dynamic voltage and frequency scaling (D...
TVLSI
2008
13 years 9 months ago
2008
Thermal hot spots and high temperature gradients degrade reliability and performance, and increase cooling costs and leakage power. In this paper, we explore the benefits of temper...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract--Leakage power consumption contributes significantly to the overall power dissipation for systems that are manufactured in advanced deep sub-micron technology. Different f...
VLSI
2012
Springer
12 years 4 months ago
2012
Springer
e technique is based on abstract execution profiles, called event signatures, and it operates at a higher level of abstraction than, for example, commonly used instruction-set sim...