8600 search results - page 4 / 1720 » Measuring with Timed Patterns |
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
OSS
2009
Springer
14 years 3 months ago
2009
Springer
This paper presents a novel method and algorithm to measure the size of an open source project’s user base and the level of potential user interest that it generates. Previously ...
ETRA
2010
ACM
13 years 6 months ago
2010
ACM
A great need exists in many fields of eye-tracking research for a robust and general method for scanpath comparisons. Current measures either quantize scanpaths in space (string e...
AINTEC
2005
Springer
14 years 2 months ago
2005
Springer
Packet loss patterns over unidirectional satellite link provide useful information for improving the performance of applications like bulk data transfer to many recipients. In this...
PAKDD
2009
ACM
14 years 5 months ago
2009
ACM
Since mining frequent patterns from transactional databases involves an exponential mining space and generates a huge number of patterns, efficient discovery of user-interest-based...