1748 search results - page 25 / 350 » Methods to Create and Use Cross-Domain Analysis Patterns |
ASPDAC
2007
ACM
13 years 12 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
CIKM
2006
Springer
13 years 11 months ago
2006
Springer
The detection of new information in a document stream is an important component of many potential applications. In this work, a new novelty detection approach based on the identif...
SFM
2009
Springer
14 years 2 months ago
2009
Springer
Abstract. As systems become more service oriented and processes increasingly cross organizational boundaries, interaction becomes more important. New technologies support the devel...
MVA
1994
13 years 9 months ago
1994
Image processing technology plays an important part in the analysis and evaluation of pavement surface cracking. The pattern recognition method for crack geometry proposed in this...
CHI
2005
ACM
14 years 8 months ago
2005
ACM
This paper describes a new collaboration technology that is based on the support of lightweight, informally structured, opportunistic activities featuring heterogeneous threads of...