81 search results - page 6 / 17 » Methods to reduce test application time for accumulator-base... |
SERA
2005
Springer
14 years 2 months ago
2005
Springer
In recent years, embedded systems have become so complex and the development time to market is required to be shorter than before. As embedded systems include more functions for n...
BMCBI
2005
13 years 8 months ago
2005
Background: Reconstructing regulatory networks from gene expression profiles is a challenging problem of functional genomics. In microarray studies the number of samples is often ...
ATS
2002
IEEE
14 years 1 months ago
2002
IEEE
In this paper, we present a technique for reducing the test length of counter-based pseudo-exhaustive built-in self-testing (BIST) based on width compression method. More formally...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
IJSSE
2010
13 years 5 months ago
2010
This paper presents an approach for retrofitting existing web applications with runtime protection against known as well as unseen SQL injection attacks (SQLIAs) without the invol...