81 search results - page 8 / 17 » Methods to reduce test application time for accumulator-base... |
ICCD
2002
IEEE
14 years 5 months ago
2002
IEEE
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
SAC
2009
ACM
14 years 3 months ago
2009
ACM
Software developers use testing to gain and maintain confidence in the correctness of a software system. Automated reduction and prioritization techniques attempt to decrease the...
BMCBI
2008
13 years 8 months ago
2008
Background: Survival time is an important clinical trait for many disease studies. Previous works have shown certain relationship between patients' gene expression profiles a...
AVSS
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper is concerned with a particular application of image stabilization1 . Image stabilization is a necessary step to reduce the effect of camera motion when, as in this case...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
Testing of embedded cores is very difficult in SOC (system-on-a-chip), since the core user may not know the gate level implementation of the core, and the controllability and obse...