1605 search results - page 29 / 321 » Metric Learning to Rank |
PROMISE
2010
13 years 4 months ago
2010
BACKGROUND: Defect predictors learned from static code measures can isolate code modules with a higher than usual probability of defects. AIMS: To improve those learners by focusi...
IJCAI
2007
13 years 11 months ago
2007
In recent years, metric learning in the semisupervised setting has aroused a lot of research interests. One type of semi-supervised metric learning utilizes supervisory informatio...
ECML
2007
Springer
14 years 4 months ago
2007
Springer
Conventional classification learning allows a classifier to make a one shot decision in order to identify the correct label. However, in many practical applications, the problem ...
ICML
2010
IEEE
13 years 11 months ago
2010
IEEE
This paper introduces two new methods for label ranking based on a probabilistic model of ranking data, called the Plackett-Luce model. The idea of the first method is to use the ...
NIPS
2004
13 years 11 months ago
2004
Many interesting multiclass problems can be cast in the general framework of label ranking defined on a given set of classes. The evaluation for such a ranking is generally given ...