1605 search results - page 29 / 321 » Metric Learning to Rank |
124
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PROMISE
2010
14 years 10 months ago
2010
BACKGROUND: Defect predictors learned from static code measures can isolate code modules with a higher than usual probability of defects. AIMS: To improve those learners by focusi...
128
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IJCAI
2007
15 years 4 months ago
2007
In recent years, metric learning in the semisupervised setting has aroused a lot of research interests. One type of semi-supervised metric learning utilizes supervisory informatio...
130
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ECML
2007
Springer
15 years 9 months ago
2007
Springer
Conventional classification learning allows a classifier to make a one shot decision in order to identify the correct label. However, in many practical applications, the problem ...
126
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ICML
2010
IEEE
15 years 4 months ago
2010
IEEE
This paper introduces two new methods for label ranking based on a probabilistic model of ranking data, called the Plackett-Luce model. The idea of the first method is to use the ...
118
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NIPS
2004
15 years 4 months ago
2004
Many interesting multiclass problems can be cast in the general framework of label ranking defined on a given set of classes. The evaluation for such a ranking is generally given ...