— We consider problems where multiple agents must cooperate to control their individual state so as to optimize a common objective while communicating with each other to exchange...
Testing of VLSI circuits can cause generation of excessive heat which can damage the chips under test. In the random testing environment, high-performance CMOS circuits consume sig...
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley,...
In the paper we present a model based method for generating 3D face models from multiple images by means of an energy minimization algorithm. The energy function takes into accoun...
Abstract— In this paper, we propose exact and heuristic algorithms for minimizing the memory size for heterogeneous Multivalued Decision Diagrams (MDDs). In a heterogeneous MDD, ...
Recently, an approach has been presented to minimize Disjoint Sumof-Products (DSOPs) based on Binary Decision Diagrams (BDDs). Due to the symbolic representation of cubes for larg...