2 search results - page 1 / 1 » Minimizing Defective Part Level Using a Linear Programming-B... |
ATS
2003
IEEE
14 years 1 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
ICIP
2003
IEEE
14 years 10 months ago
2003
IEEE
This paper proposes a new method of designing finitesupport wavelet filters, based on minimization of energy in key parts of the frequency domain. In particular this technique is ...