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JAVACARD
2000
13 years 11 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
VTS
1999
IEEE
71views Hardware» more  VTS 1999»
13 years 11 months ago
Test Generation for Ground Bounce in Internal Logic Circuitry
Ground bounce in internal circuitry is becoming an important design validation and test issue. In this paper a new circuit model for ground bounce in internal circuitry is propose...
Yi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer
ASWEC
2005
IEEE
14 years 1 months ago
A UML Approach to the Generation of Test Sequences for Java-Based Concurrent Systems
Starting with a UML specification that captures the underlying functionality of some given Java-based concurrent system, we describe a systematic way to construct, from this speci...
Soon-Kyeong Kim, Luke Wildman, Roger Duke
SE
2007
13 years 9 months ago
Requirements traceability in the model-based testing process
: Automated test case and test driver generation from a precise behaviour UML model is an emerging approach for software functional validation. This innovative approach for validat...
Eddy Bernard, Bruno Legeard
WSC
2008
13 years 9 months ago
A plug-in-based architecture for random number generation in simulation systems
Simulations often depend heavily on random numbers, yet the impact of random number generators is recognized seldom. The generation of random numbers for simulations is not trivia...
Roland Ewald, Johannes Rossel, Jan Himmelspach, Ad...