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DAC
2000
ACM
14 years 8 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
PTS
1993
106views Hardware» more  PTS 1993»
13 years 8 months ago
Generating Synchronizable Test Sequences Based on Finite State Machine with Distributed Ports
In the area of testing communication systems, the interfaces between systems to be tested and their testers have great impact on test generation and fault detectability. Several t...
Gang Luo, Rachida Dssouli, Gregor von Bochmann, Pa...
SE
2008
13 years 9 months ago
Using UML Environment Models for Test Case Generation
We propose a new method for system validation by means of testing, which is based on environment models expressed as UML state machines. A sun blind control case study serves to il...
Maritta Heisel, Denis Hatebur, Thomas Santen, Dirk...
ISSRE
2006
IEEE
14 years 1 months ago
A Systematic Approach to Generate Inputs to Test UML Design Models
Practical model validation techniques are needed for model driven development (MDD) techniques to succeed. This paper presents an approach to generating inputs to test UML design ...
Trung T. Dinh-Trong, Sudipto Ghosh, Robert B. Fran...
DAC
1999
ACM
13 years 11 months ago
IC Test Using the Energy Consumption Ratio
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
Wanli Jiang, Bapiraju Vinnakota