3031 search results - page 23 / 607 » Model Driven Testing Based on Test History |
DAC
2005
ACM
14 years 9 months ago
2005
ACM
The challenge of verifying a modern microprocessor design is an overwhelming one: Increasingly complex micro-architectures combined with heavy time-to-market pressure have forced ...
FM
2009
Springer
13 years 6 months ago
2009
Springer
Abstract. This paper presents an iterative technique to accurately reverseengineer models of the behaviour of software systems. A key novelty of the approach is the fact that it us...
ITC
1998
IEEE
14 years 22 days ago
1998
IEEE
This paper explores defects found in a high volume microprocessor when shipping at a low defect level. A brief description of the manufacturing flow along with definition of DPM i...
TAICPART
2006
IEEE
14 years 2 months ago
2006
IEEE
CORR
2008
Springer
13 years 8 months ago
2008
Springer
Research on formulae production in spreadsheets has established the practice as high risk yet unrecognised as such by industry. There are numerous software applications that are d...