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» Model Driven Testing Based on Test History
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ITC
2000
IEEE
93views Hardware» more  ITC 2000»
14 years 26 days ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
GI
2001
Springer
14 years 29 days ago
Extending Sunit to Test Components
To ensure the deployment of reusable and reliable components, it is important to verify their functionality. In this paper, we present a framework for component testing, an extens...
Ludger Martin, Elke Siemon
HICSS
2003
IEEE
179views Biometrics» more  HICSS 2003»
14 years 1 months ago
JUMBL: A Tool for Model-Based Statistical Testing
Statistical testing of software based on a usage model is a cost-effective and efficient means to make inferences about software quality. In order to apply this method, a usage m...
Stacy J. Prowell
ATS
2000
IEEE
145views Hardware» more  ATS 2000»
14 years 27 days ago
Compaction-based test generation using state and fault information
We present a new test generation procedure for sequential circuits using newly traversed state and newly detected fault information obtained between successive iterations of vecto...
Ashish Giani, Shuo Sheng, Michael S. Hsiao, Vishwa...
IJCAI
2007
13 years 10 months ago
Fault-Model-Based Test Generation for Embedded Software
Testing embedded software systems on the control units of vehicles is a safety-relevant task, and developing the test suites for performing the tests on test benches is time-consu...
Michael Esser, Peter Struss