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DAC
1996
ACM
13 years 11 months ago
Characterization and Parameterized Random Generation of Digital Circuits
The development of new Field-Programmed, MaskProgrammed and Laser-Programmed Gate Array architectures is hampered by the lack of realistic test circuits that exercise both the arc...
Michael D. Hutton, Jerry P. Grossman, Jonathan Ros...
DAC
2000
ACM
14 years 8 months ago
Self-test methodology for at-speed test of crosstalk in chip interconnects
The effect of crosstalk errors is most significant in highperformance circuits, mandating at-speed testing for crosstalk defects. This paper describes a self-test methodology that...
Xiaoliang Bai, Sujit Dey, Janusz Rajski
ICST
2008
IEEE
14 years 2 months ago
Model-Based Tests for Access Control Policies
We present a model-based approach to testing access control requirements. By using combinatorial testing, we first automatically generate test cases from and without access contro...
Alexander Pretschner, Tejeddine Mouelhi, Yves Le T...
ICSE
2001
IEEE-ACM
14 years 1 days ago
A Scalable Formal Method for Design and Automatic Checking of User Interfaces
The paper addresses the formal specification, design and implementation of the behavioral component of graphical user interfaces. The complex sequences of visual events and action...
Jean Berstel, Stefano Crespi-Reghizzi, Gilles Rous...
ICST
2008
IEEE
14 years 2 months ago
On Combining Multi-formalism Knowledge to Select Models for Model Transformation Testing
Testing remains a major challenge for model transformation development. Test models that are used as test data for model transformations, are constrained by various sources of kno...
Sagar Sen, Benoit Baudry, Jean-Marie Mottu