627 search results - page 103 / 126 » Model-Driven Generation and Optimization of Complex Integrat... |
DAC
2010
ACM
14 years 20 days ago
2010
ACM
Fault simulation is essential in test generation, design for test and reliability assessment of integrated circuits. Reliability analysis and the simulation of self-test structure...
GIS
2007
ACM
14 years 10 months ago
2007
ACM
In this paper we present a novel system for the detection and extraction of road map information from high-resolution satellite imagery. Uniquely, the proposed system is an integr...
DAC
2005
ACM
14 years 10 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
HOTI
2008
IEEE
14 years 3 months ago
2008
IEEE
We present a new monolithic silicon photonics technology suited for integration with standard bulk CMOS processes, which reduces costs and improves opto-electrical coupling compar...
LCN
2006
IEEE
14 years 3 months ago
2006
IEEE
Network monitoring is a major building block for many domains in communication networks. Besides typical accounting mechanisms and the emerging area of charging in next generation...