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DAC
2007
ACM
14 years 2 months ago
2007
ACM
ISQED
2008
IEEE
14 years 5 months ago
2008
IEEE
The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
DT
2006
13 years 11 months ago
2006
at their abstractions are similar to data types and operations supplied by conventional processors. A core principle of BCPL is its memory model: an The Challenges of Synthesizing ...
PODC
2009
ACM
14 years 8 months ago
2009
ACM
The era of parallel computing for the masses is here, but writing correct parallel programs remains far more difficult than writing sequential programs. Aside from a few domains,...
ER
2007
Springer
14 years 2 months ago
2007
Springer
The paper presents an unified Description Logic (DL) model for databases. Describing database models using DLs is a fundamental problem in many areas because it turns databases to...