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» Modeling and testing of cloud applications
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KDD
2000
ACM
211views Data Mining» more  KDD 2000»
14 years 7 days ago
Mining IC test data to optimize VLSI testing
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
Tony Fountain, Thomas G. Dietterich, Bill Sudyka
CLOUD
2010
ACM
14 years 1 months ago
Virtual machine power metering and provisioning
Virtualization is often used in cloud computing platforms for its several advantages in efficiently managing resources. However, virtualization raises certain additional challeng...
Aman Kansal, Feng Zhao, Jie Liu, Nupur Kothari, Ar...
COMPUTING
2007
101views more  COMPUTING 2007»
13 years 8 months ago
Reverse engineering with subdivision surfaces
Reverse engineering is concerned with the reconstruction of surfaces from three-dimensional point clouds originating from laser-scanned objects. We present an adaptive surface rec...
P. Keller, Martin Bertram, Hans Hagen
DDECS
2009
IEEE
149views Hardware» more  DDECS 2009»
14 years 16 days ago
Physical design oriented DRAM Neighborhood Pattern Sensitive Fault testing
Although the Neighborhood Pattern Sensitive Fault (NPSF) model is recognized as a high quality fault model for memory arrays, the excessive test application time cost associated wi...
Yiorgos Sfikas, Yiorgos Tsiatouhas
ICWS
2010
IEEE
13 years 10 months ago
WebMov: A Dedicated Framework for the Modelling and Testing of Web Services Composition
This paper presents a methodology and a set of tools for the modelling, validation and testing of Web service composition, conceived and developed within the French national projec...
Ana R. Cavalli, Tien-Dung Cao, Wissam Mallouli, El...