1718 search results - page 85 / 344 » Modeling and testing of cloud applications |
VLSID
2005
IEEE
14 years 3 months ago
2005
IEEE
During pseudorandom testing, a significant amount of energy and test application time is wasted for generating and for applying “useless” test vectors that do not contribute t...
ETS
2006
IEEE
14 years 4 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ICDE
2011
IEEE
13 years 1 months ago
2011
IEEE
—Complex SQL queries are widely used today, but it is rather difficult to check if a complex query has been written correctly. Formal verification based on comparing a specifi...
ICSE
2008
IEEE-ACM
14 years 10 months ago
2008
IEEE-ACM
Mutants are automatically-generated, possibly faulty variants of programs. The mutation adequacy ratio of a test suite is the ratio of non-equivalent mutants it is able to identif...
LATA
2009
Springer
14 years 4 months ago
2009
Springer
We show that fixed membership testing for many interesting subclasses of multi-pushdown machines is no harder than for pushdowns with single stack. The models we consider are MVPA...