Parameter variation due to manufacturing error will be an unavoidable consequence of technology scaling in future generations. The impact of random variation in physical factors s...
Ke Meng, Frank Huebbers, Russ Joseph, Yehea I. Ism...
Constructing correct distributed systems from their high-level models has always been a challenge and often subject to serious errors because of their non-deterministic and non-at...
Borzoo Bonakdarpour, Marius Bozga, Mohamad Jaber, ...
We develop two simple interval-based models for dynamic superscalar processors. These models allow us to: i) predict with great accuracy performance and power consumption under va...
The standardisation procedure of the IEEE P1394.1 Draft Standard for High Performance Serial Bus Bridges is supported through the use of the state-of-the-art model checker Spin, w...
We use the technique of SVM anchoring to demonstrate that lexical features extracted from a training corpus are not necessary to obtain state of the art results on tasks such as N...