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VLSID
2005
IEEE
170views VLSI» more  VLSID 2005»
14 years 1 months ago
A High-Efficiency, Dual-Mode, Dynamic, Buck-Boost Power Supply IC for Portable Applications
Abstract—Integrated power supplies are critical building blocks in stateof-the-art portable applications, where they efficiently and accurately transform a battery supply into va...
Biranchinath Sahu, Gabriel A. Rincón-Mora
VLSID
2004
IEEE
139views VLSI» more  VLSID 2004»
14 years 7 months ago
Open Defects Detection within 6T SRAM Cells using a No Write Recovery Test Mode
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
André Ivanov, Baosheng Wang, Josh Yang
ITC
1996
IEEE
98views Hardware» more  ITC 1996»
13 years 11 months ago
Mixed-Mode BIST Using Embedded Processors
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Sybille Hellebrand, Hans-Joachim Wunderlich, Andre...
SCS
2004
13 years 9 months ago
A Method and Tool Support for Model-based Semi-automated Failure Modes and Effects Analysis of Engineering Designs
Limitations in scope but also difficulties with the efficiency and scalability of present algorithms seem to have so far limited the industrial uptake of existing automated FMEA t...
Yiannis Papadopoulos, David Parker 0002, Christian...
HICSS
2003
IEEE
151views Biometrics» more  HICSS 2003»
14 years 24 days ago
A Simple GSPN for Modeling Common Mode Failures in Critical Infrastructures
It is now apparent that our nation’s infrastructures and essential utilities have been optimized for reliability in benign operating environments. As such, they are susceptible ...
Axel W. Krings, Paul W. Oman