Abstract—Integrated power supplies are critical building blocks in stateof-the-art portable applications, where they efficiently and accurately transform a battery supply into va...
The detection of all open defects within 6T SRAM cells is always a challenge due to the significant test time requirements. This paper proposes a new design-for-test (DFT) techniq...
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
Limitations in scope but also difficulties with the efficiency and scalability of present algorithms seem to have so far limited the industrial uptake of existing automated FMEA t...
Yiannis Papadopoulos, David Parker 0002, Christian...
It is now apparent that our nation’s infrastructures and essential utilities have been optimized for reliability in benign operating environments. As such, they are susceptible ...