150 search results - page 8 / 30 » Multi-Level Test Models for Embedded Systems |
HIPEAC
2005
Springer
14 years 26 days ago
2005
Springer
Abstract. Power efficiency has become a key design trade-off in embedded system designs. For system-on-a-chip embedded systems, an external bus interconnects embedded processor co...
IEEECIT
2010
IEEE
13 years 5 months ago
2010
IEEE
—As the need for embedded systems to interact with other systems is growing fast, we see great opportunities in introducing the hardware-in-the-loop technique to the field of ha...
LCTRTS
2009
Springer
14 years 2 months ago
2009
Springer
Embedded systems, like general-purpose systems, can benefit from parallel execution on a symmetric multicore platform. Unfortunately, concurrency issues present in general-purpos...
TSE
2011
13 years 2 months ago
2011
—Conventional testing methods often fail to detect hidden flaws in complex embedded software such as device drivers or file systems. This deficiency incurs significant developmen...
ASPDAC
1995
ACM
13 years 11 months ago
1995
ACM
One of the interesting problems in hardware-software co-design is that of debugging embedded software in conjunction with hardware. Currently, most software designers wait until a...