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ITC
2003
IEEE
129views Hardware» more  ITC 2003»
14 years 1 months ago
Relating Yield Models to Burn-In Fall-Out in Time
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product,...
Thomas S. Barnett, Adit D. Singh
FSKD
2007
Springer
102views Fuzzy Logic» more  FSKD 2007»
13 years 9 months ago
Statistical and Fuzzy Approach for Database Security
A new type of database anomaly is described by addressing the concept of Cumulated Anomaly in this paper. Dubiety-Determining Model (DDM), which is a detection model basing on sta...
Gang Lu, Junkai Yi, Kevin Lü
FORTE
2004
13 years 9 months ago
Formal Verification of Web Applications Modeled by Communicating Automata
In this paper, we present an approach for modeling an existing web application using communicating finite automata model based on the userdefined properties to be validated. We ela...
May Haydar, Alexandre Petrenko, Houari A. Sahraoui
INTERSPEECH
2010
13 years 2 months ago
Online adaptive learning for speech recognition decoding
We describe a new method for pruning in dynamic models based on running an adaptive filtering algorithm online during decoding to predict aspects of the scores in the near future....
Jeff Bilmes, Hui Lin
ICIP
2003
IEEE
14 years 9 months ago
A probabilistic framework for image segmentation
A new probabilistic image segmentation model based on hypothesis testing and Gibbs Random Fields is introduced. First, a probabilistic difference measure derived from a set of hyp...
Slawo Wesolkowski, Paul W. Fieguth