234 search results - page 10 / 47 » Multiple Faults: Modeling, Simulation and Test |
ICCAD
1995
IEEE
13 years 11 months ago
1995
IEEE
In this paper, a new approach to analog test design based on the circuit design process, called Characteristic Observation Inference (COI), is presented. In many situations, it is...
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
— We propose an automatic test pattern generation (ATPG) framework for combinational threshold networks. The motivation behind this work lies in the fact that many emerging nanot...
ITC
2003
IEEE
14 years 1 months ago
2003
IEEE
Composite microsystems that integrate mechanical and fluidic components are fast emerging as the next generation of system-on-chip designs. As these systems become widespread in s...
JUCS
2007
13 years 7 months ago
2007
: This paper describes a method of using Petri net P-invariants in system diagnosis. To model this process a net oriented fault classification is presented. Hence, the considered d...
VTS
2002
IEEE
14 years 22 days ago
2002
IEEE
We present a software-based weighted random pattern scheme for testing delay faults in IP cores of programmable SoCs. We describe a method for determining static and transition pr...