766 search results - page 37 / 154 » Multiple-view feature modelling for integral product develop... |
ISQED
2005
IEEE
14 years 1 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
WWW
2008
ACM
14 years 8 months ago
2008
ACM
With the explosive growth of Web and the recent development in digital media technology, the number of images on the Web has grown tremendously. Consequently, Web image clustering...
ECCV
2006
Springer
14 years 9 months ago
2006
Springer
The paper introduces a new framework for feature learning in classification motivated by information theory. We first systematically study the information structure and present a n...
ISORC
2007
IEEE
14 years 1 months ago
2007
IEEE
Methodologies, techniques and tools that currently support the embedded systems (ESs) development process prove inadequate for today’s complex ESs. Adopted traditional architect...
ERCIM
2008
13 years 7 months ago
2008
The increasing complexity of distributed embedded systems, as found today in airplanes or cars, becomes more and more a critical cost-factor for their development. Model-based app...