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DFT
2002
IEEE
79views VLSI» more  DFT 2002»
14 years 19 days ago
Neural Networks-Based Parametric Testing of Analog IC
Viera Stopjaková, D. Micusík, Lubica...
PRIS
2004
13 years 9 months ago
Neural Network Learning: Testing Bounds on Sample Complexity
Several authors have theoretically determined distribution-free bounds on sample complexity. Formulas based on several learning paradigms have been presented. However, little is kn...
Joaquim Marques de Sá, Fernando Sereno, Lu&...