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27

DFT
2002
IEEE

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Neural Networks-Based Parametric Testing of Analog IC

14 years 4 months ago

Neural Networks-Based Parametric Testing of Analog IC

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Viera Stopjaková, D. Micusík, Lubica

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Added	14 Jul 2010
Updated	14 Jul 2010
Type	Conference
Year	2002
Where	DFT
Authors	Viera Stopjaková, D. Micusík, Lubica Benusková, Martin Margala

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