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JETC
2008
50views more  JETC 2008»
13 years 7 months ago
Parametric yield management for 3D ICs: Models and strategies for improvement
Cesare Ferri, Sherief Reda, R. Iris Bahar
JCSS
2006
40views more  JCSS 2006»
13 years 7 months ago
A parametric analysis of the state-explosion problem in model checking
Stéphane Demri, François Laroussinie...
MJ
2008
80views more  MJ 2008»
13 years 7 months ago
Dielectric function analysis of ZnSe and CdSe using parametric semiconductor model
We present the dielectric function spectra of ZnSe and CdSe at room temperature between 0.7 and 9 eV obtained by vacuum ultraviolet ellipsometry measurement. We have observed the ...
Y. W. Jung, J. J. Yoon, J. S. Byun, Y. D. Kim
TR
2008
80views more  TR 2008»
13 years 7 months ago
Parametric Model Discrimination for Heavily Censored Survival Data
A. Daniel Block, Lawrence Leemis