1015 search results - page 4 / 203 » New Area Management Method Based on |
TCAD
2002
13 years 6 months ago
2002
Chemical-mechanical polishing (CMP) and other manufacturing steps in very deep submicron VLSI have varying effects on device and interconnect features, depending on local character...
AAAI
2010
13 years 8 months ago
2010
We report a new error-aware monocular visual odometry method that only uses vertical lines, such as vertical edges of buildings and poles in urban areas as landmarks. Since vertic...
MTSR
2007
Springer
14 years 1 months ago
2007
Springer
In this paper we identify the requirements for creating formal descriptions of learning scenarios designed under the European Higher Education Area paradigm, using competences and ...
ICC
2007
IEEE
14 years 1 months ago
2007
IEEE
— – Major research challenges in the next generation of wireless networks include the provisioning of worldwide seamless mobility across heterogeneous wireless networks, the im...
CEC
2008
IEEE
14 years 1 months ago
2008
IEEE
— In this paper, a new meta-method based on the physical nuclear process is presented. This meta-method called Fusion-Fission is applied to the two different class of graph parti...