When VLSI technology scales toward 45nm, the lithography wavelength stays at 193nm. This large gap results in strong refractive effects in lithography. Consequently, it is a huge...
Abstract A co-location pattern is a group of spatial features/events that are frequently co-located in the same region. For example, human cases of West Nile Virus often occur in r...
During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
In this paper, we propose a novel probabilistic approach to summarize frequent itemset patterns. Such techniques are useful for summarization, post-processing, and end-user interp...
In the paper a new measure of distance between events/observations in the pattern space is proposed and experimentally evaluated with the use of k-NN classifier in the context of b...