30 search results - page 4 / 6 » New Schemes for Self-Testing RAM |
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...
SIGIR
2008
ACM
13 years 7 months ago
2008
ACM
The classical probabilistic models attempt to capture the Ad hoc information retrieval problem within a rigorous probabilistic framework. It has long been recognized that the prim...
AMW
2010
13 years 9 months ago
2010
We study query authentication schemes, algorithmic and cryptographic constructions that provide efficient and secure protocols for verifying the results of queries over structured...
EDCC
1999
Springer
13 years 11 months ago
1999
Springer
Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric ver...
CORR
2010
Springer
13 years 4 months ago
2010
Springer
In this paper we propose a new wavelet transform applicable to functions defined on graphs, high dimensional data and networks. The proposed method generalizes the Haar-like transf...