Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms

Abstract. The paper presents a new approach to transparent BIST for wordoriented RAMs which is based on the transformation of March transparent test algorithms to the symmetric versions. This approach allows to skip the signature prediction phase inherent to conventional transparent memory testing and therefore to significantly reduce test time. The hardware overhead and fault coverage of the new BIST scheme are comparable to the conventional transparent BIST structures. Experimental results show that in many cases the proposed test techniques achieve a higher fault coverage in shorter test time.

• Type: Conference
• Year: 1999
• Where: EDCC
• Authors: Vyacheslav N. Yarmolik, I. V. Bykov, Sybille Hellebrand, Hans-Joachim Wunderlich
• Keywords: Applied Computing, Conventional Transparent, Conventional Transparent Bist, EDCC 1999, Transparent Bist