853 search results - page 5 / 171 » New test approach for embedded applications |
KDD
2006
ACM
14 years 7 months ago
2006
ACM
Motivated by the problem of customer wallet estimation, we propose a new setting for multi-view regression, where we learn a completely unobserved target (in our case, customer wa...
HASKELL
2009
ACM
14 years 1 months ago
2009
ACM
We present by example a new application domain for functional languages: emulators for embedded real-time protocols. As a casestudy, we implement a simple emulator for the Biphase...
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
Abstract—Today we can identify a big gap between requirement specification and the generation of test environments. This article extends the Classification Tree Method for Embe...
DAC
1997
ACM
13 years 11 months ago
1997
ACM
Novel test bench techniques are required to cope with a functional test complexity which is predicted to grow much more strongly than design complexity. Our test bench approach at...
DFT
2002
IEEE
14 years 11 days ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...