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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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128
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DSD
2007
IEEE
83views Hardware» more  DSD 2007»
15 years 12 months ago
Hierarchical Identification of Untestable Faults in Sequential Circuits
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kru...
ICANN
2003
Springer
15 years 10 months ago
Sparse Coding with Invariance Constraints
We suggest a new approach to optimize the learning of sparse features under the constraints of explicit transformation symmetries imposed on the set of feature vectors. Given a set...
Heiko Wersing, Julian Eggert, Edgar Körner
163
Voted
CIARP
2009
Springer
15 years 10 months ago
Neural Network Ensembles from Training Set Expansions
Abstract. In this work we propose a new method to create neural network ensembles. Our methodology develops over the conventional technique of bagging, where multiple classifiers ...
Debrup Chakraborty
ICRA
2000
IEEE
89views Robotics» more  ICRA 2000»
15 years 10 months ago
A Robotic Stepper for Retraining Locomotion in Spinal-Injured Rodents
We describe the design and testing of a robotic system to assist locomotion training of spinal-injured rodents. The goal of the system is to control and quantify spatialtemporal p...
David J. Reinkensmeyer, Wojciech K. Timoszyk, Ray ...
EURODAC
1994
IEEE
110views VHDL» more  EURODAC 1994»
15 years 9 months ago
Symbolic exploration of large circuits with enhanced forward/backward traversals
Symbolic state space exploration techniques for Finite State Machines (FSMs) are a major recent result in CAD for VLSI. Most of them are exact and based on forward traversal, but ...
Gianpiero Cabodi, Paolo Camurati, Stefano Quer