Sciweavers

980 search results - page 21 / 196
» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
Sort
View
INTEGRATION
2006
102views more  INTEGRATION 2006»
13 years 9 months ago
A parameterized graph-based framework for high-level test synthesis
Improving testability during the early stages of high-level synthesis has several benefits including reduced test hardware overheads, reduced test costs, reduced design iterations...
Saeed Safari, Amir-Hossein Jahangir, Hadi Esmaeilz...
ICCAD
2006
IEEE
113views Hardware» more  ICCAD 2006»
14 years 6 months ago
A novel framework for faster-than-at-speed delay test considering IR-drop effects
Faster-than-at-speed test have been proposed to detect small delay defects. While these techniques increase the test frequency to reduce the positive slack of the path, they exace...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
ICCAD
2007
IEEE
109views Hardware» more  ICCAD 2007»
14 years 1 months ago
CacheCompress: a novel approach for test data compression with cache for IP embedded cores
Abstract-- In this paper, we propose a novel test data compression technique named CacheCompress, which combines selective encoding and dynamic dictionary based encoding. Depending...
Hao Fang, Chenguang Tong, Bo Yao, Xiaodi Song, Xu ...
ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
14 years 1 months ago
RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
Hao Fang, Chenguang Tong, Xu Cheng
TSE
2010
155views more  TSE 2010»
13 years 3 months ago
Incremental Test Generation for Software Product Lines
Recent advances in mechanical techniques for systematic testing have increased our ability to automatically find subtle bugs, and hence to deploy more dependable software. This pap...
Engin Uzuncaova, Sarfraz Khurshid, Don S. Batory