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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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ICSE
2009
IEEE-ACM
14 years 3 months ago
WISE: Automated test generation for worst-case complexity
Program analysis and automated test generation have primarily been used to find correctness bugs. We present complexity testing, a novel automated test generation technique to ...
Jacob Burnim, Sudeep Juvekar, Koushik Sen
TACAS
2005
Springer
158views Algorithms» more  TACAS 2005»
14 years 2 months ago
Symstra: A Framework for Generating Object-Oriented Unit Tests Using Symbolic Execution
Object-oriented unit tests consist of sequences of method invocations. Behavior of an invocation depends on the method’s arguments and the state of the receiver at the beginning ...
Tao Xie, Darko Marinov, Wolfram Schulte, David Not...
ICCD
2006
IEEE
127views Hardware» more  ICCD 2006»
14 years 6 months ago
Power Droop Testing
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
Ilia Polian, Alejandro Czutro, Sandip Kundu, Bernd...
CVPR
2012
IEEE
11 years 11 months ago
Icon scanning: Towards next generation QR codes
Undoubtedly, a key feature in the popularity of smartmobile devices is the numerous applications one can install. Frequently, we learn about an application we desire by seeing it ...
Itamar Friedman, Lihi Zelnik-Manor
TACAS
2009
Springer
122views Algorithms» more  TACAS 2009»
14 years 3 months ago
Test Input Generation for Programs with Pointers
Software testing is an essential process to improve software quality in practice. Researchers have proposed several techniques to automate parts of this process. In particular, sym...
Dries Vanoverberghe, Nikolai Tillmann, Frank Piess...