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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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DFT
2006
IEEE
203views VLSI» more  DFT 2006»
15 years 11 months ago
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
Ondrej Novák, Zdenek Plíva, Jiri Jen...
EDCC
2005
Springer
15 years 11 months ago
PathCrawler: Automatic Generation of Path Tests by Combining Static and Dynamic Analysis
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
Nicky Williams, Bruno Marre, Patricia Mouy, Muriel...
GI
2001
Springer
15 years 10 months ago
Testing Distributed Component Based Systems Using UML/OCL
We present a pragmatic approach using formal methods to increase the quality of distributed component based systems: Based on UML class diagrams annotated with OCL constraints, co...
Achim D. Brucker, Burkhart Wolff
160
Voted
ACL
2003
15 years 7 months ago
A Word-Order Database for Testing Computational Models of Language Acquisition
An investment of effort over the last two years has begun to produce a wealth of data concerning computational psycholinguistic models of syntax acquisition. The data is generated...
William Gregory Sakas
ATS
2005
IEEE
191views Hardware» more  ATS 2005»
15 years 11 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed