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» Novel Test Pattern Generators for Pseudo-Exhaustive Testing
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DFT
2006
IEEE
203views VLSI» more  DFT 2006»
14 years 3 months ago
Self Testing SoC with Reduced Memory Requirements and Minimized Hardware Overhead
This paper describes a methodology of creating a built-in diagnostic system of a System on Chip and experimental results of the system application on the AT94K FPSLIC with cores d...
Ondrej Novák, Zdenek Plíva, Jiri Jen...
EDCC
2005
Springer
14 years 2 months ago
PathCrawler: Automatic Generation of Path Tests by Combining Static and Dynamic Analysis
Abstract. We present the PathCrawler prototype tool for the automatic generation of test-cases satisfying the rigorous all-paths criterion, with a user-defined limit on the number...
Nicky Williams, Bruno Marre, Patricia Mouy, Muriel...
GI
2001
Springer
14 years 1 months ago
Testing Distributed Component Based Systems Using UML/OCL
We present a pragmatic approach using formal methods to increase the quality of distributed component based systems: Based on UML class diagrams annotated with OCL constraints, co...
Achim D. Brucker, Burkhart Wolff
ACL
2003
13 years 10 months ago
A Word-Order Database for Testing Computational Models of Language Acquisition
An investment of effort over the last two years has begun to produce a wealth of data concerning computational psycholinguistic models of syntax acquisition. The data is generated...
William Gregory Sakas
ATS
2005
IEEE
191views Hardware» more  ATS 2005»
14 years 2 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed