980 search results - page 60 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DAC
1997
ACM
14 years 1 months ago
1997
ACM
This paper presents a new scan-based BIST scheme which achieves very high fault coverage without the deficiencies of previously proposed schemes. This approach utilizes scan order...
KBSE
2007
IEEE
14 years 3 months ago
2007
IEEE
Modularity is one of the most important properties of a software design, with significant impact on changeability and evolvability. However, a formalized and automated approach i...
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is diffic...
CORR
2010
Springer
13 years 9 months ago
2010
Springer
A Transaction database contains a set of transactions along with items and their associated timestamps. Transitional patterns are the patterns which specify the dynamic behavior o...
EURODAC
1995
IEEE
14 years 19 days ago
1995
IEEE
This paper describes the features and design methodology of MIDA, a MPEG1 integrated audio decoder. MIDA has been almost completely designed using automatic synthesis of VHDL desc...