980 search results - page 66 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DELTA
2004
IEEE
14 years 24 days ago
2004
IEEE
Manufacturing test of chips made of multiple IP cores requires different techniques if ATE is used. As scan chains are commonly used as access paths to the DUT, ATE architectures ...
ISCI
2008
13 years 9 months ago
2008
Automatic software testing tools are still far from ideal for real world object-oriented (OO) software. The use of nature inspired search algorithms for this problem has been inve...
ARVLSI
1995
IEEE
14 years 19 days ago
1995
IEEE
This paper presents an architecture for generating a high-speed data pattern with precise edge placement resolution by using the matched delay technique. The technique involves ...
GECCO
2004
Springer
14 years 2 months ago
2004
Springer
In this paper, a novel multi-objective orthogonal simulated annealing algorithm MOOSA using a generalized Pareto-based scale-independent fitness function and multi-objective intell...
IJCAI
2007
13 years 10 months ago
2007
Traditional classification involves building a classifier using labeled training examples from a set of predefined classes and then applying the classifier to classify test instan...