980 search results - page 67 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
ASPDAC
2004
ACM
14 years 2 months ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
TII
2008
13 years 9 months ago
2008
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
AMOST
2007
ACM
14 years 1 months ago
2007
ACM
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...
ICIP
2001
IEEE
14 years 10 months ago
2001
IEEE
Face recognition has established itself as an important subbranch of pattern recognition within the field of computer science. Many state-of-the-art systems have focused on the ta...
GECCO
2006
Springer
14 years 21 days ago
2006
Springer
1 Learnable Evolution Model (LEM) is a form of non-Darwinian evolutionary computation that employs machine learning to guide evolutionary processes. Its main novelty are new type o...