- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
Xiang Lu, Zhuo Li, Wangqi Qiu, D. M. H. Walker, We...
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
Kyung Ki Kim, Jing Huang, Yong-Bin Kim, Fabrizio L...
We have devised a novel technique to automatically generate test cases for a software system, combining black-box model-based testing with white-box parameterized unit testing. Th...
Nicolas Kicillof, Wolfgang Grieskamp, Nikolai Till...
Face recognition has established itself as an important subbranch of pattern recognition within the field of computer science. Many state-of-the-art systems have focused on the ta...
1 Learnable Evolution Model (LEM) is a form of non-Darwinian evolutionary computation that employs machine learning to guide evolutionary processes. Its main novelty are new type o...