980 search results - page 8 / 196 » Novel Test Pattern Generators for Pseudo-Exhaustive Testing |
DATE
2004
IEEE
14 years 29 days ago
2004
IEEE
This paper presents 3LSSD, a novel, easilyautomatable approach for scan insertion and ATPG of asynchronous circuits. 3LSSD inserts scan latches only into global circuit feedback p...
GECCO
2009
Springer
14 years 1 months ago
2009
Springer
This paper introduces TestFul, a framework for testing stateful systems and focuses on object-oriented software. TestFul employs a hybrid multi-objective evolutionary algorithm, t...
XPU
2004
Springer
14 years 2 months ago
2004
Springer
Abstract. While there are many excellent acceptance testing tools and frameworks available today, this paper presents an alternative approach, involving generating code from tests ...
TCAD
2008
13 years 9 months ago
2008
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
ATS
2009
IEEE
14 years 4 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...