Sciweavers

223 search results - page 22 / 45
» Object-Oriented Programming Testing Methodology
Sort
View
JAVACARD
2000
13 years 11 months ago
Automatic Test Generation for Java-Card Applets
: Open-cards have introduced a new life cycle for smart card embedded applications. In the case of Java Card, they have raised the problem of embedded object-oriented applet valida...
Hugues Martin, Lydie du Bousquet
DFT
2002
IEEE
128views VLSI» more  DFT 2002»
14 years 26 days ago
Matrix-Based Test Vector Decompression Using an Embedded Processor
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
Kedarnath J. Balakrishnan, Nur A. Touba
IJCV
2008
106views more  IJCV 2008»
13 years 8 months ago
Evaluation of Localized Semantics: Data, Methodology, and Experiments
We present a new data set encoding localized semantics for 1014 images and a methodology for using this kind of data for recognition evaluation. This methodology establishes protoc...
Kobus Barnard, Quanfu Fan, Ranjini Swaminathan, An...
STEP
2005
IEEE
14 years 1 months ago
TETE: A Non-Invasive Unit Testing Framework for Source Transformation
While the use of test-driven development as a debugging, pedagogic, and analytical methodology for objectoriented and procedural systems is well documented, it is a relatively une...
Derek M. Shimozawa, James R. Cordy
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
14 years 1 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...