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IEEEVAST
2010
13 years 3 months ago
Interactive querying of temporal data using a comic strip metaphor
Finding patterns in temporal data is an important data analysis task in many domains. Static visualizations can help users easily see certain instances of patterns, but are not sp...
Jing Jin, Pedro A. Szekely
ITCC
2005
IEEE
14 years 2 months ago
Event-Based Blackboard Architecture for Multi-Agent Systems
Developing large multi-agent systems is a complex task involving the processes of the requirement, architecture, design and implementation of these systems. In particular, the arc...
Jing Dong, Shanguo Chen, Jun-Jang Jeng
DAC
2009
ACM
14 years 9 months ago
Double patterning lithography friendly detailed routing with redundant via consideration
In double patterning lithography (DPL), coloring conflict and stitch minimization are the two main challenges. Post layout decomposition algorithm [1] [2]may not be enough to achi...
Kun Yuan, Katrina Lu, David Z. Pan
DATE
2003
IEEE
108views Hardware» more  DATE 2003»
14 years 2 months ago
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
Abstract : A novel design methodology for test pattern generation in BIST is presented. Here faults and errors in the generator itself are detected. Two different design methodolog...
Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakr...
COMPSAC
2007
IEEE
14 years 3 months ago
On Identifying Bug Patterns in Aspect-Oriented Programs
Bug patterns are erroneous code idioms or bad coding practices that have been proved fail time and time again. They mainly arise from the misunderstanding of language features, th...
Sai Zhang, Jianjun Zhao