1721 search results - page 127 / 345 » On Active and Passive Testing |
111
Voted
DAC
2009
ACM
16 years 5 months ago
2009
ACM
The discrepancy between integrated circuits' activities in normal functional mode and that in structural test mode has an increasing adverse impact on the effectiveness of ma...
132
Voted
KBSE
2008
IEEE
15 years 11 months ago
2008
IEEE
One activity performed by developers during regression testing is test-suite augmentation, which consists of assessing the adequacy of a test suite after a program is modified an...
135
click to vote
ICSE
2009
IEEE-ACM
15 years 9 months ago
2009
IEEE-ACM
Structural testing is widely used in industrial verification processes of critical software. This report presents PathCrawler, a structural test generation tool that may be used ...
131
click to vote
DAC
1997
ACM
15 years 8 months ago
1997
ACM
An ATPG technique is proposed that reduces heat dissipation during testing of sequential circuits that have full-scan. The objective is to permit safe and inexpensive testing of l...
129
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DAC
2007
ACM
16 years 5 months ago
2007
ACM
Many STUMPS architectures found in current chip designs allow disabling of individual scan chains for debug and diagnosis. In a recent paper it has been shown that this feature can...