584 search results - page 1 / 117 » On Applying Set Covering Models to Test Set Compaction |
GLVLSI
1999
IEEE
13 years 11 months ago
1999
IEEE
ICTAC
2004
Springer
14 years 25 days ago
2004
Springer
A model-based approach for minimization of test sets for interactive systems is introduced. Test cases are efficiently generated and selected to cover the behavioral model and the ...
ICCAD
1998
IEEE
13 years 11 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
TC
1998
13 years 7 months ago
1998
—Many built-in self-testing (BIST) schemes compress the test responses from a k-output circuit to q signature streams, where q << k, a process termed space compaction. The ...
JMLR
2002
13 years 7 months ago
2002
We extend the classical algorithms of Valiant and Haussler for learning compact conjunctions and disjunctions of Boolean attributes to allow features that are constructed from the...