584 search results - page 59 / 117 » On Applying Set Covering Models to Test Set Compaction |
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
- For sub-90nm technology nodes and below, random fluctuations of within-die physical process properties are also known as random on-chip variation (OCV). It impacts on the VLSI/So...
ISI
2008
Springer
13 years 7 months ago
2008
Springer
We present a generative model for determining the information content of a message without analyzing the message content. Such a tool is useful for automated analysis of the vast ...
SDM
2008
SIAM
13 years 9 months ago
2008
SIAM
Sample selection bias is a common problem in many real world applications, where training data are obtained under realistic constraints that make them follow a different distribut...
CIE
2008
Springer
13 years 9 months ago
2008
Springer
There are many ways to define complexity in logic. In finite model theory, it is the complexity of describing properties, whereas in proof complexity it is the complexity of provin...
FGR
2008
IEEE
13 years 9 months ago
2008
IEEE
The phenomenal growth of video on the web and the increasing sparseness of meta information associated with it forces us to look for signals from the video content for search/info...