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DAC
2008
ACM
14 years 9 months ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
DAC
2007
ACM
14 years 9 months ago
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
DAC
2007
ACM
14 years 9 months ago
A System For Coarse Grained Memory Protection In Tiny Embedded Processors
Many embedded systems contain resource constrained microcontrollers where applications, operating system components and device drivers reside within a single address space with no...
Ram Kumar, Akhilesh Singhania, Andrew Castner, Edd...
DAC
2007
ACM
14 years 9 months ago
RQL: Global Placement via Relaxed Quadratic Spreading and Linearization
This paper describes a simple and effective quadratic placement algorithm called RQL. We show that a good quadratic placement, followed by local wirelength-driven spreading can pr...
Natarajan Viswanathan, Gi-Joon Nam, Charles J. Alp...
DAC
2000
ACM
14 years 9 months ago
Fingerprinting intellectual property using constraint-addition
Recently, intellectual property protection (IPP) techniques attracted a great deal of attention from semiconductor, system integration and software companies. A number of watermar...
Gang Qu, Miodrag Potkonjak
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