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TCAD
2010
13 years 5 months ago
2010
Artificial neural networks (ANNs) have shown great promise in modeling circuit parameters for computer aided design applications. Leakage currents, which depend on process paramete...
ICIP
2002
IEEE
15 years 14 days ago
2002
IEEE
Techniques for informationhidinghave become increasingly more sophisticated and widespread. With high-resolution digital images as carriers, detecting hidden messages has become c...
STOC
1994
ACM
14 years 3 months ago
1994
ACM
We present new results on the well-studied problem of learning DNF expressions. We prove that an algorithm due to Kushilevitz and Mansour [13] can be used to weakly learn DNF form...
ASPDAC
2008
ACM
14 years 27 days ago
2008
ACM
In the nanometer manufacturing region, process variation causes significant uncertainty for circuit performance verification. Statistical static timing analysis (SSTA) is thus dev...
DATE
2010
IEEE
14 years 4 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...