Failures triggered by hard to debug defects usually involve complex interactions between many program elements. We hypothesize that information flows present a good model for such ...
Extreme technology scaling in silicon devices drastically affects reliability, particularly because of runtime failures induced by transistor wearout. Currently available online t...
In this paper, we describe a scheme for tolerating and recovering from mid-query faults in a distributed shared nothing database. Rather than aborting and restarting queries, our s...
Christopher Yang, Christine Yen, Ceryen Tan, Samue...
Process monitoring refers to the task of detecting abnormal process operations resulting from the shift in the mean and/or the variance of one or more process variables. To success...
The decomposition of complex systems into manageable parts is an essential principle when dealing with complex technical systems. However, many safety and reliability modelling te...