799 search results - page 73 / 160 » On Failures and Faults |
ISCA
2007
IEEE
14 years 3 months ago
2007
IEEE
High availability is an increasingly important requirement for enterprise systems, often valued more than performance. Systems designed for high availability typically use redunda...
DAC
2009
ACM
14 years 1 months ago
2009
ACM
Process scaling has given designers billions of transistors to work with. As feature sizes near the atomic scale, extensive variation and wearout inevitably make margining unecono...
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper, we analyze failing circuits and propose a multiple-fault diagnosis approach. Our methodology has been validated experimentally and has proved to be highly efficient...
INFOCOM
2007
IEEE
14 years 3 months ago
2007
IEEE
— Internet backbone networks are under constant flux, struggling to keep up with increasing demand. The pace of technology change often outstrips the deployment of associated fa...
PERCOM
2004
ACM
14 years 8 months ago
2004
ACM
Large sensor networks in applications such as surveillance and virtual classrooms, have to deal with the explosion of sensor information. Coherent presentation of data coming from...