Formal methods can improve the development of systems with high quality requirements, since they usually o er a precise, nonambiguous speci cation language and allow rigorous veri ...
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
This paper explores the concept of design diversity redundancy applied to mixed-signal (MS) circuit blocks, as a proposal to increase system reliability. Three different implement...