1187 search results - page 48 / 238 » On Modeling Cross-Talk Faults |
FTRTFT
2000
Springer
14 years 9 days ago
2000
Springer
Formal methods can improve the development of systems with high quality requirements, since they usually o er a precise, nonambiguous speci cation language and allow rigorous veri ...
ITC
2000
IEEE
14 years 1 months ago
2000
IEEE
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
MTDT
2000
IEEE
14 years 1 months ago
2000
IEEE
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
ITC
1994
IEEE
14 years 24 days ago
1994
IEEE
For obtaining a zero defect level, a high fault coverage with respect to the stuck-at fault model is often not sufficient as there are many defects that show a more complex behavi...
ETS
2010
IEEE
13 years 9 months ago
2010
IEEE
This paper explores the concept of design diversity redundancy applied to mixed-signal (MS) circuit blocks, as a proposal to increase system reliability. Three different implement...